Quasi-static conformal-mapping analysis (Ghione & Naldi 1987). Valid when W, S ≪ λ.
| Quantity | Formula |
|---|---|
| Geometry modulus | k = W / (W + 2S) k′ = √(1 − k²) |
| Substrate factor k1 (conventional) | k1 = sinh(πW / 4h) / sinh(π(W + 2S) / 4h) |
| Substrate factor k2 (CBCPW) | k2 = tanh(πW / 4h) / tanh(π(W + 2S) / 4h) |
| εeff (conventional CPW) | 1 + (εr − 1) / 2 × [K(k1) / K(k1′)] / [K(k) / K(k′)] |
| εeff (CBCPW) | [K(k)/K(k′) + εr K(k2)/K(k2′)] / [K(k)/K(k′) + K(k2)/K(k2′)] |
| Z0 (conventional CPW) | (30π / √εeff) × K(k′) / K(k) |
| Z0 (CBCPW) | 60π / [√εeff × (K(k)/K(k′) + K(k2)/K(k2′))] |
| K(k) | Complete elliptic integral of the first kind — computed via arithmetic-geometric mean (AGM) |
| Phase velocity & guided wavelength | vph = c / √εeff λg = c / (f √εeff) |
| What is εeff? | The effective permittivity experienced by the propagating mode. CPW fields extend into both the substrate (εr) and the air (1), so εeff is a weighted average between them. It determines phase velocity and guided wavelength. For a thick substrate (W, S ≪ h): εeff → (1 + εr) / 2. For a thin substrate without back GND: εeff → 1. For a thin substrate with back GND: εeff → εr. |